★★★★★ 5
item as describes, fast shipping
Format: Paperback
great seller fast shipping
WAS THIS REVIEW HELPFUL?YesReportShare
Reviewed in the United States on July 22, 2021
High Resolution Calibration Standards for AFM, SEM, Auger, 145 & 292nm pitch
Marsoni
M251S
Get it in 3 business days with 1 day shipping.
Friday, May 29
High Resolution Calibration Standards for AFM, SEM, Auger, 145 & 292nm pitchHolographic Grating for Scanning Electron Microscopy, Atomic Force Microscopy, Auger and Focused Ion Beam Precision, holographic patterns, provide accurate calibration and feature high stability and usability. Moderate ridge heights are convenient for AFM. Specimens provide good contrast for secondary and backscatter imaging with SEM. They enable accurate calibration for high resolution, nanometer scale measurements. Available with 145 and 292nm
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